Tonghui TH2829 Series - Page 7

TH2829X Series Operation Manual Contents
VII
7.16 Frequently asked questions and answers in transformer scan test
135
7.16.1 High and low limits ........................................................ 135
7.16.2 Measurement item loss .................................................. 135
7.16.3 Measurement interruption .............................................. 136
7.16.4 Poor DCR accuracy ........................................................ 136
7.16.5 Poor Lk accuracy ........................................................... 136
7.16.6 Inaccurate TURN ........................................................... 136
7.16.7 Unstable TURN .............................................................. 137
7.16.8 Difference between the first and the second Lx .................. 137
7.16.9 Poor stability of Cx and Zx open test data ......................... 137
7.16.10 DCR and PS open cannot reach infinite large ..................... 137
7.17 User-made test fixture ......................................................... 137
7.17.1 Use TH1801-EXT2A-OUT to make test fixture .................... 138
7.17.2 Example of using TH1801-EXT11A(5.0)-B pin signal ........... 139
7.17.3 Scan test interface board ................................................ 139
7.18 Self-check function of scanner relay ...................................... 140
7.18.1 Operation steps for scan self-check .................................. 140
7.18.2 Displayed information on screen ...................................... 141
7.18.3 Detection method for relay short ..................................... 142
Chapter 8 Performance and Test .......................................................... 143
8.1 Test function ...................................................................... 143
8.1.1 Parameter and symbol ................................................... 143
8.1.2 Test combination ........................................................... 143
8.1.3 Mathematical operation .................................................. 143
8.1.4 Equivalent mode ........................................................... 143
8.1.5 Range .......................................................................... 143
8.1.6 Trigger ......................................................................... 143
8.1.7 Delay time ................................................................... 144
8.1.8 Connection modes of test terminals ................................. 144
8.1.9 Test speed (Frequency>=10kHz) ..................................... 144
8.1.10 Average ....................................................................... 144
8.1.11 Display digit ................................................................. 144
8.2 Test signal ......................................................................... 144
8.2.1 Test signal frequency ..................................................... 144
8.2.2 Signal mode ................................................................. 145
8.2.3 Test signal level ............................................................ 145
8.2.4 Output impedance ......................................................... 145
8.2.5 Monitor for test signal level ............................................. 145
8.2.6 Maximum measurement display range .............................. 145
8.2.7 DC bias voltage source ................................................... 146
8.2.8 Diode test .................................................................... 146
8.3 Measurement accuracy ........................................................ 146
8.3.1 │Z│,│Y│, L, C, R, X, G, B accuracies ............................. 146