ICS-3000 Ion Chromatography System
178 Doc. 065031-04 1/08
8.2 Noisy Baseline
• Eluent is contaminated
1. Clean all eluent reservoirs thoroughly (inside and out) with ASTM Type I
(18 megohm-cm) filtered and deionized water and dry with clean,
particulate-free air. If a reservoir still appears dirty, or if there is a slimy
film on the interior, follow the cleaning instructions in Section 9.2
.
2. Flush the system with ASTM Type I (18 megohm-cm) filtered and
deionized water.
3. Replace all end-line filters (P/N 045987). See Section 4.4
for instructions.
4. Prepare new stock solution.
5. Prepare fresh eluent. To ensure eluent purity, prepare all eluents with
spectro-grade eluents, reagent-grade chemicals, and ASTM Type I
(18 megohm-cm) filtered and deionized water.
• DP/SP not properly primed
Prime the pump (see Section 9.3
).
• Piston seal is damaged
If the piston seal is damaged, it allows liquid leaks. Leaks are usually visible,
and thus easily detected. If necessary, replace the piston seal (see Section 9.5
).
• Inadequate system or cell backpressure
Add backpressure tubing to the cell outlet (see Section 9.23.4
) or to the pump
(if no column is installed).
• (EG Only) System backpressure is below 14 MPa (2000 psi)
When the EG is installed, the optimal system backpressure is 16 MPa
(2300 psi). Low system backpressure may cause high baseline noise as the
eluent concentration increases in the gradient. To correct this, install a
backpressure coil in the EG after the RFIC Eluent Degasser (see
Section 9.15
).
• Flow system leak ahead of cell
Check all fittings and liquid lines for leaks. Tighten or, if necessary, replace
all liquid line connections (see Section 9.17
).
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