TH2829X Series Operation Manual Chapter 10 HANDLER
(4) Press the softkey ON to enable the comparison function.
(5) Press [DISP], and then press the sotfkey BIN NO. or BIN COUNT, the DUT will
be tested; at the same time, you can set the counter for the DUT and the
auxiliary.
Note: COMP ON/OFF can be set in BIN COUNT page.
The procedure for list sweep comparison:
(1)Press LIST SETUP, LIST SWEEP SETUP page will be displayed.
(2)Set the sweep mode, sweep frequency point, reference value, the high limit
and the low limit. Refer to the [DISP] key description to see more details.
(3)Press [DISP] and then press the softkey LIST SWEEP, LIST SWEEP DISP page
will be displayed. Refer to the DISP key description to see more details.
Note: the following methods can be used to improve the speed:
(1)Set the range to the maximum that the capacitance may be, and lock this
range.
(2)Set Vm: OFF and Im: OFF in the MEAS SETUP page.
(3)Test the DUT in the BIN COUNT page.
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