Hioki IM3536 - X84; ROM;RAM Test; X84; Testing EXT I;O Input;Output Signals

135
Testing the System (Self diagnosis)
ROM/RAM test
Allows you to check the instrument’s internal memory (ROM and RAM) for errors.
Screen display method (For more information, see p. 28.):
(Measurement screen) SYS key>(SYS screen) TEST tab
1
Touch the ROM/RAM TEST key.
Starts the test. (Approx. 40 seconds)
No operation is possible during the ROM/
RAM test.
Never turn off the power during a test.
If the overall judgment result indication is
PASS, the test ended normally.
If the overall judgment result indication is NG,
the instrument needs to be repaired. Contact
your authorized Hioki distributor or reseller.
2
Touch the EXIT key twice.
Displays the measurement screen.
Testing EXT I/O input/output signals
Allows you to verify that output signals are output normally from EXT I/O and that input signals can
be read properly.
Screen display method (For more information, see p. 28.):
(Measurement screen) SYS key>(SYS screen) TEST tab>I/O HANDLER TEST key
1
(To perform an output signal test)
Touch the button with the name of the
signal for which you want to check the
output.
(To perform an input signal test)
Input a signal and verify that the signal
line name
*
is displayed in the window.
To perform an output signal test
To perform an input signal test
*: Names of signals that are being input (LO)
2
Touch the EXIT key twice.
Displays the measurement screen.
On the test screen, an input signal does not
cause the trigger to be enabled or panel to
be loaded.
7
Setting the System