Hioki IM3536 - (Detecting Poor Contact with the Sample During 4-Terminal Measurement)

85
Setting Application Settings
Contact check function ( detecting poor contact with the sample dur-
ing 4-terminal measurement)
This functionality allows you to detect contact defects between the terminals (H
CUR
, H
POT
, L
CUR
, and
L
POT
) and the sample during 4-terminal measurement.
Set the contact resistance between L
POT
and L
CUR
and between H
POT
and H
CUR
. If the measured
value is greater than or equal to the set threshold, an error message will be displayed.
An error message will be displayed in the measured value display area on the measurement
screen. (See "Contact error" in the "11.3 Error Massage and Error Display" (p. 230).)
Screen display method (For more information, see p. 24):
(Measurement screen) SET key>(SET screen) ADVANCED tab>CONTACT key
1
Select the timing at which to perform
contact check operation.
OFF Disables the contact check function.
BEFORE Performs a contact check before
measuring the sample.
AFTER Performs a contact check after mea-
suring the sample.
BOTH
Performs a contact check before
and after measuring the
sample .
Selecting BOTH or BEFORE as the contact
check timing causes the trigger synchronous
output function (p. 64) to be automatically
turned on.
2
Set the contact check threshold with the
 key.
Settable range: 1 to 5
Threshold
(SENS)
Permissible contact
resistance [
Ω
]
1 Approx. 1000
2 Approx. 500
3 Approx. 100
4 Approx. 50
5 Approx. 20
3
(Set only when the contact check func-
tion does not operate correctly.)
Set the contact check delay time with
the  key.
Settable range: 100 µs to 1 s
Touching the C key causes the value to be
set to 0 s.
• When the sample is a high-capacitance ca-
pacitor, the contact check function may not
operate normally under some measurement
conditions.
• Contact check measurements are made in the
following order: (1) between L
POT
and L
CUR
and
then (2) between H
POT
and H
CUR
. Measurement
(2) will be delayed by the set delay time.
4
Touch the EXIT key twice.
Displays the measurement screen.
• When setting the contact check function,
the INDEX
―― ― ――
time and EOM
―――
time will be de-
layed depending on the timing (p. 218).
• The allowable contact resistance value may vary
depending on the sample being measured.
• The measurement value will not be saved
when all three of the following conditions
apply: the memory function (p. 86) is seto
to ON, the timing is set to BEFORE, a con-
tact error has been displayed
3
Performing Measurements in LCR Mode