Debug in Depth
ARM DDI 0210C Copyright © 2001, 2004 ARM Limited. All rights reserved. B-21
The following scan chain control signals can also be used for scan chain 3:
nHIGHZ This signal can be used to drive the outputs of the scan cells to the HIGH
impedance state. This signal is driven LOW when the HIGHZ instruction
is loaded into the instruction register and HIGH at all other times.
RSTCLKBS This signal is active when the TAP controller state machine is in the
RESET-TEST LOGIC state. It can be used to reset any additional scan
cells.
In addition to these control outputs, SDINBS output and SDOUTBS input are also
provided. When an external scan chain is in use, SDOUTBS must be connected to the
serial data output of the external scan chain and SDINBS must be connected to the serial
data input of the scan chain.
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