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Agilent Technologies Nano Indenter G200 - Frame Stiffness and Indenter Area Function Theory; Instrument Frame Stiffness: Indentation Definition

Agilent Technologies Nano Indenter G200
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Theory 7
Agilent Nano Indenter G200 User’s Guide 7-9
Frame Stiffness and Indenter Area Function Theory
The following information covers the calibration of instrument frame
stiffness and indenter area function for the Agilent G200 NanoIndenters
having:
ONLY NanoSuite 6.1 or later
ONLY Berkovich tips
XP, DCM, or DCM II head
For a foundational understanding of Instrumented Indentation Testing
(IIT), we recommend beginning with these five articles:
Sneddon I.N., "The relation between load and penetration in the
axisymmetric boussinesq problem for a punch of arbitrary
profile," Int. J. Engng. Sci., 3, p.47, 1965.
Pharr, G.M., Oliver, W.C., and Brotzen, F.R., "On the Generality
of the Relationship among Contact Stiffness, Contact Area, and
Elastic-Modulus during Indentation," Journal of Materials
Research 7(3), 613-617, 1992.
Oliver, W.C. and Pharr, G.M., "An Improved Technique for
Determining Hardness and Elastic-Modulus Using Load and
Displacement Sensing Indentation Experiments," Journal of
Materials Research 7(6), 1564-1583, 1992.
Hay, J.L., "Introduction to Instrumented Indentation Testing,"
Experimental Techniques 33(6), 66-72, 2009.
Hay, J.L., Agee, P., and Herbert, E.G., "Continuous Stiffness
Measurement during Instrumented Indentation Testing,"
Experimental Techniques 34(3), 86-94, 2010
Instrument Frame Stiffness: Indentation Definition
A single value, K
f
, having the dimensions of force per unit length,
characterizes the composite elastic stiffness of everything which may
deform as a result of the testing force. The frame stiffness is
characterized in a way that influences the measured displacement,
except the indenter tip and the sample, as shown in
Figure 7-3 on
page 7-10.

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