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Agilent Technologies Nano Indenter G200 User Manual

Agilent Technologies Nano Indenter G200
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Theory 7
Agilent Nano Indenter G200 User’s Guide 7-9
Frame Stiffness and Indenter Area Function Theory
The following information covers the calibration of instrument frame
stiffness and indenter area function for the Agilent G200 NanoIndenters
having:
• ONLY NanoSuite 6.1 or later
• ONLY Berkovich tips
• XP, DCM, or DCM II head
For a foundational understanding of Instrumented Indentation Testing
(IIT), we recommend beginning with these five articles:
• Sneddon I.N., "The relation between load and penetration in the
axisymmetric boussinesq problem for a punch of arbitrary
profile," Int. J. Engng. Sci., 3, p.47, 1965.
• Pharr, G.M., Oliver, W.C., and Brotzen, F.R., "On the Generality
of the Relationship among Contact Stiffness, Contact Area, and
Elastic-Modulus during Indentation," Journal of Materials
Research 7(3), 613-617, 1992.
• Oliver, W.C. and Pharr, G.M., "An Improved Technique for
Determining Hardness and Elastic-Modulus Using Load and
Displacement Sensing Indentation Experiments," Journal of
Materials Research 7(6), 1564-1583, 1992.
• Hay, J.L., "Introduction to Instrumented Indentation Testing,"
Experimental Techniques 33(6), 66-72, 2009.
• Hay, J.L., Agee, P., and Herbert, E.G., "Continuous Stiffness
Measurement during Instrumented Indentation Testing,"
Experimental Techniques 34(3), 86-94, 2010
Instrument Frame Stiffness: Indentation Definition
A single value, K
f
, having the dimensions of force per unit length,
characterizes the composite elastic stiffness of everything which may
deform as a result of the testing force. The frame stiffness is
characterized in a way that influences the measured displacement,
except the indenter tip and the sample, as shown in
Figure 7-3 on
page 7-10.

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Agilent Technologies Nano Indenter G200 Specifications

General IconGeneral
BrandAgilent Technologies
ModelNano Indenter G200
CategoryLaboratory Equipment
LanguageEnglish

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