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Agilent Technologies Nano Indenter G200 User Manual

Agilent Technologies Nano Indenter G200
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Express Test I
Agilent Nano Indenter G200 User’s Guide H-10
Stiffness (N/m): Contact stiffness, averaged over all valid indents in the
test array. If the contact stiffness is more than 10
% of the frame
stiffness, best results may require the determination of frame stiffness
on the test sample using the
Express Test, Varied Force method.
Express Test to a Force
The purpose of the method is to use Express Test for rapid
characterization of Young's modulus and hardness by performing an
array of indentations to a user-defined force and is available as both
Batch (Method Name-Batch) and Individual Methods. The method may
be used on bulk materials or for the mapping of mechanical properties.
1 Launch NanoSuite.
2 At the User Login prompt, select the proper profile name and click
OK.
3 From the Open Method dialog box, select Express Test > Batch>
Express Test to a Force-Batch for a Batch test as shown in
Figure H-8 or Express Test> Express Test to a Force as an
Individual test.
Figure H-8Select Express Test to a Force from the Open Method dialog
box
4 Click Open.
5 Locate sample target area using the microscope image (40X
Objective recommended).
6 Adjust the Panel Inputs as needed:
• Memo: Provides space for user-specified information about each
test.
• Poisson's Ratio: The Poisson's Ratio for the test material.
• Prescribed Load: Maximum indentation force.
• Surface Approach Distance: This input may either be set to
Standard or High. Use the High setting for rough samples. Using
High will increase test time.

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Agilent Technologies Nano Indenter G200 Specifications

General IconGeneral
BrandAgilent Technologies
ModelNano Indenter G200
CategoryLaboratory Equipment
LanguageEnglish

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