Instrument Reference 3
Agilent Nano Indenter G200 User’s Guide 3-10
Lateral Force Measurement
The Lateral Force Measurement (LFM) option, available on the Nano
Indenter G200, enables measurement of forces in the X-Y plane. This in
turn enables the calculation of the scratch friction coefficient for
scratches made in any direction. The resolution for frictional force
measurement is better than 10
mN over a range of 200 mN.
The LFM probes, which are mounted in the indenter head, are shown in
Figure 3- 12 and described in more detail in Appendix F, "Lateral Force
Measurement".
Figure3- 12Lateral Force Measurement probes for LFM option
Locking Pins
The locking pins, shown in Figure 3- 13, fix the indenter shaft so that
the head is not damaged during a tip change or other contact with the
diamond.
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