E-1
Agilent Nano Indenter G200
User’s Guide
Agilent Technologies
E
Scratch Testing
Quick Start Guide E-2
NanoSuite Reference E-6
Required Inputs E-6
Markers E-8
Editable Post-Test Inputs E-9
Results E-9
Theory E-11
Plastically Deformed Scratches E-11
Fractured Scratches E-12
Influence of Indenter Geometry E-13
Measure of Indenter Geometry Using the Indentation
Technique E-14
Time-Dependent Properties Acting on Scratch Behavior E-16
Relaxation E-16
Mechanisms E-19
Originally developed for depth-sensing indentation testing, the standard
Nano Indenter G200 can also do controlled scratch tests. The Nano
Indenter G200 indentation/scratch head is load-controlled. The load is
applied normal to the sample surface by the electromagnetic system.
During a scratch test, the normal force on the sample is controlled and
can be held constant, increased, or decreased. Scratch velocity and
scratch path followed by the indenter on the specimen surface are
defined by the test method.
Although the standard G200 can perform standard scratch testing, the
Lateral Force Measurement (LFM) option enables you to measure
lateral forces on the indenter during the scratch. The LFM option is
discussed in
Appendix F, "Lateral Force Measurement".
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