Agilent Technologies Nano Indenter G200 User Manual

F-1
Agilent Nano Indenter G200
User’s Guide
Agilent Technologies
F
Lateral Force Measurement
Quick Start Guide F-2
Theory F-4
The Lateral Force Measurement (LFM) option, available on the Nano
Indenter G200, enables measurement of forces in the X-Y plane. This in
turn enables the calculation of the scratch friction coefficient for
scratches made in any direction. The resolution for frictional force
measurement is better than 10
mN over a range of 200 mN.
NOTE
This section references material for Scratch Testing. Be sure to review
and understand
Appendix E, "Scratch Testing" before continuing with
LFM.

Agilent Technologies Nano Indenter G200 Specifications

General

Brand	Agilent Technologies
Model	Nano Indenter G200
Category	Laboratory Equipment
Language	English