Agilent Technologies Nano Indenter G200 - F Lateral Force Measurement; Quick Start Guide Theory; Quick Start Guide

F-1
Agilent Nano Indenter G200
User’s Guide
Agilent Technologies
F
Lateral Force Measurement
Quick Start Guide F-2
Theory F-4
The Lateral Force Measurement (LFM) option, available on the Nano
Indenter G200, enables measurement of forces in the X-Y plane. This in
turn enables the calculation of the scratch friction coefficient for
scratches made in any direction. The resolution for frictional force
measurement is better than 10
mN over a range of 200 mN.
NOTE
This section references material for Scratch Testing. Be sure to review
and understand
Appendix E, "Scratch Testing" before continuing with
LFM.