Agilent Technologies Nano Indenter G200 User Manual

Theory 7
Agilent Nano Indenter G200 User’s Guide 7-12
(16)
(17)
(18)
(19)
For example, using a G200 system with an XP head and the following
parameters, a plot of total compliance vs (1/P) will be similar to that
shown in
Figure 7-5 on page 7-13:
• Berkovich diamond on fused silica
• 20 independent indentations, each to a different peak force
• Each symbol on the plot represents the results of one complete
indentation.
• F
max
= 500 mN
• F
min
= 68 mN
Additional considerations:
• High force results are the most valuable for determining frame
stiffness.
• Low force results are not valuable or even detrimental.
• Indents having a maximum displacement of less than 200 nm should
not be included in the calculation of frame stiffness.
1
E
r
-----
1 v
2
–
E
-------------------
1 v
i
2
–
E
i
-------------------+=
1
K

-------

2E
r
---------
1
A
-------



1
K
f
-----+=
H
P
A
---=


1
A
-------
H
P
----=



1
K

-------
H
2E
r
------------
1
P
-------



1
K
f
-----+=

Agilent Technologies Nano Indenter G200 Specifications

General

Brand	Agilent Technologies
Model	Nano Indenter G200
Category	Laboratory Equipment
Language	English