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Agilent Technologies Nano Indenter G200 - Page 308

Agilent Technologies Nano Indenter G200
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Theory 7
Agilent Nano Indenter G200 User’s Guide 7-11
(13)
(14)
The instrument frame stiffness calibration provides the value of K
f
. If
the reduced modulus and hardness are constant (not even necessarily
known) then a plot of total compliance (1/K
f
) vs. (1/P) is a line with
intercept of 1/K
f
. This is shown schematically in Figure 7-4.
Figure 7-4Schematic representation of instrument frame stiffness
calibration
These parameters are detailed in the following equations:
(15)
where
1 K
1 K
f
1 S+=
S 1 K
1 K
f

1
=
1
S
---
E
r
2 A
-------------=

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