Express Test I
Agilent Nano Indenter G200 User’s Guide H-13
differently. Thus, when it is important to know K
f
well, it is important to
determine it on the sample that is actually being tested, or in situ. This
test method provides a means for determining K
f
in situ.
There are no user-defined inputs for this method. The test method
automatically probes the material over the force range of the DCM
II
(up to 30
mN). Indents that are not appropriate for analysis (because
applied force is too high or too low) can be disregarded after testing is
complete.
Run the method using these steps:
1 Launch NanoSuite.
2 At the User Login prompt, select the proper profile name and click
OK.
3 From the Open Method dialog box, select Express Test > Express
Test, Varied Force as shown in
Figure H-9
Figure H-9Select Express Test, Varied Force from the Open Method
dialog box
4 Click Open.
5 Locate sample target area using the microscope image (40X
Objective recommended).
6 Click the Run button.
Once testing is complete, the software will prompt the user to save the
file.
7 Input a file name and click Save.
8 To view the results, click the Review tab.
The 2D data is available by selecting the Channels tab as shown in
Figure H-6 on page H-8.
The 3D data is available by selecting the 3D tab as shown in Figure H-7
on page H-9.
To Next Page
Loading...
Need help?
General
