Additional Maintenance Procedures
555-233-143
5-26 Issue 1 May 2002
Analog Tie Trunk Back-to-Back Testing
The TN760 circuit pack can be configured for back-to-back testing (also known as
connectivity testing) by making translation and cross-connect changes. This
testing configuration allows for the connection of tie trunks back-to-back in the
same switch to verify the operation of tie trunk ports. The tests can be performed
in either the E&M or simplex modes.
E&M Mode Test Procedure
1. At the administration terminal, enter list configuration trunks to
determine which ports are assigned on the Tie Trunk circuit pack.
2. Enter display dialplan command to determine the Trunk Access Code
(TAC) format.
3. Enter display port xxx for every port defined in step 1. This displays the
trunk groups of which the ports are members. For details about removing
and replacing port circuit packs, see ‘‘Reseating and Replacing Circuit
Packs’’ on page 4-7.
4. Insert the circuit pack back into the slot.
5. Enter display trunk xxx p for each trunk group identified in step 3. This
command displays the specified trunk group on the administration terminal
screen and prints a hard copy on the printer. Save this data for later use.
6. Remove every member defined by these ports from the trunk group(s)
using the change trunk xxx command.
7. Remove the Tie Trunk circuit pack from the carrier slot.
8. Set the dip (option) switches for each of the two ports to be tested on the
Tie Trunk circuit pack to “E&M mode” and “unprotected.”
9. Enter add trunk n to add a new (test) trunk group. Then enter information
for the following fields:
10. Locate the tie trunk port terminal connections at the cross-connect field.
Consult the appropriate table below for either 110-type or 66-type
hardware.
Group Type tie
TAC Use trunk access code obtained from dial plan
Trunk Type (in/out) wink/wink
Port Assign two of the ports from the tie trunk.
Mode E&M for both ports
Type Specify one port as t1 standard and other port
as t1 compatible.
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