Avaya S8700 - Page 927

ATM-EI (Expansion Interface Circuit Pack)
Issue 1 May 2002
8-205555-233-143
Expansion Interface 2-Way Transmission Test
(#241)
This test is nondestructive and applies to every ATM-EI, both active and standby.
It is run as part of craft short and long testing, periodic, scheduled, initialization,
and error analysis testing. The test sets up a connection between a Tone-Clock in
one cabinet and a Tone Detector in a separate cabinet and transmits a digital test
count between the EPNs. The ATM-EIs used to set up this connection are chosen
by maintenance, not call processing. After the connection is checked for
dial-tone, the connection is torn down and re-established in the opposite direction.
For this test, the second ATM-EI can reside in any EPN outside the tested
ATM-EI’s EPN. Therefore, if the test should fail in either direction, the test is
repeated with a different EPN, if available. This aids the fault isolation procedure.
The test results indicate if the test failed in one or both directions. The test aborts
if the ATM-EIs do not exist on both ends (for example, the EIs are not
administered correctly). If the test passes, the TDM and ATM framer interfaces of
both ATM-EIs are functioning properly. If the test fails, a series of tests are run on
the board. Figure 8-3 shows a schematic of this test.
Figure 8-3. Expansion Interface 2-Way Transmit Test #241
PN X and PN Y represent any of 44 possible EPNs.
Tone
clock
Tone
clock
Tone
detector
Tone
detector
PNC modePNC mode
iodf2way AWF 040699
ATM
switch
TDM bus
(PN X)
TDM bus
(PN Y)
ATM
circuit
pack
ATM
circuit
pack