2-29
IM DLM6054-01EN
Features
2
1
4
5
6
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8
9
10
11
12
13
14
15
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17
18
Index
App
section 10.8 for the procedure
There are two available tests: a mask test for analyzing a communication signal, and a test for
automatically measuring the waveform parameters of an eye pattern.
Measurement is performed on the accumulated waveforms when the mode is set to Count.
In a mask test, you can create a mask pattern with the free software supplied by YOKOGAWA, load it
into the DL6000/DLM6000, and count the number of waveforms that pass through the mask.
In an eye pattern test, the following eye pattern items are measured.
3
σ
crossing 2
3
σ
crossing 1
Eye width
Vtop
Vbase
3
σ
base 3
σ
top
Eye height
T crossing 2
T crossing 1
V crossing
Vtop Average top peak voltage of the vertical histogram
Vbase Average bottom peak voltage of the vertical histogram
σ
top Standard deviation of the top peak voltage of the vertical histogram
σ
base Standard deviation of the bottom peak voltage of the vertical histogram
Tcrossing1 Average time of the first crossing point
Tcrossing2 Average time of the second crossing point
Vcrossing Voltage at the point where the rising edge and the falling edge cross
Crossing % Level where the rising edge and the falling edge of the eye pattern intersect, expressed
as a percentage with respect to the difference between Vtop and Vbase
Eye Height Height of the eye
Eye Width Width of the eye
Q Factor Quality factor of the eye diagram expressed as a ratio of the eye height with respect to
the noise at both the high and low voltage levels
Jitter Magnitude of the time fluctuation of the first crossing point (crossing1)
Jitter2 Magnitude of the time fluctuation of the second crossing point (crossing2)
Duty Cycle Distortion % Time difference between the falling edge intermediate point and the rising edge
intermediate point as determined by the intermediate threshold level expressed as a
percentage with respect to the full bit width
Ext Rate dB Extinction rate in dB
Rise Rise time between the specified lower and upper threshold levels
Fall Fall time between the specified upper and lower threshold levels
2.8 Analysis and Searching