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Agilent Technologies 35670A User Manual

Agilent Technologies 35670A
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To measure frequency response—FFT
FFT analysis allows you to measure a device’s frequency response more quickly than
swept sine analysis. However, if the dynamic range of your device exceeds 80 dB,
you should use swept sine analysis—as described in “To measure frequency
response—swept sine.”
1 Initialize the analyzer.
Press [
Preset
][
DO PRESET
].
Press [
Inst Mode
][
FFT ANALYSIS
].
If you are using a two-channel Agilent 35670A, press [
CHANNELS 1 2
] to highlight 2.
If you are using a four-channel Agilent 35670A, press [
CHANNELS 1 2 4
] to highlight 2
or 4, then press [
REF CHANS 1 1,3
] to highlight 1.
Press [
Meas Data
][
FREQ RESP 2/1
], then—if you are measuring with four
channels—press [
CHANNEL 1 2 3 4
] to highlight the response channel you want observe.
2 Connect your device-under-test (DUT) to the source and input connectors (as shown
below).
3 Specify the measurement parameters.
Press [
Freq
][
START
] <number> <unit>, then press [
STOP
] <number> <unit>.
Press [
Source
][
PERIODIC CHIRP
][
LEVEL
] <number> <unit>.
Press [
SOURCE ON OFF
] to highlight ON.
Press [
Window
][
UNIFORM
].
Press [
Input
][
ALL CHANNELS
][
CH* AUTO UP ONLY
].
Option AY6
Agilent 35670A
Measuring Spectra and Networks Operator's Guide
4-10

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Agilent Technologies 35670A Specifications

General IconGeneral
BrandAgilent Technologies
Model35670A
CategoryMeasuring Instruments
LanguageEnglish

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