Agilent Technologies ENA Series

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Chapter 12 409

Optimizing Measurements

Reducing Measurement Error in High Temperature Environments

12. Optimizing Measurements

Reducing Measurement Error in High Temperature

Environments

The E5070B/E5071B is designed to obtain the best measurement accuracy at the ambient

temperature range of 23°C ± 5°C. The high temperature measurement mode of the

E5070B/E5071B reduces measurement error (drift error) at an ambient temperature of

28°C to 33°C.

NOTE The high temperature measurement mode must be turned off when the analyzer is used at

an ambient temperature below 28°C. Otherwise, the measurement accuracy may be

degraded.

Procedure

Step 1. Press .

Step 2. Press Service Menu.

Step 3. Press High Temperature to turn ON/OFF the high temperature measurement mode.

Main Page

Default Chapter10
- Safety Symbols10
- Table of Contents15
Precautions31
- Software Installed32
- Before Contacting Us33
Overview of Functions35
- Front Panel: Names and Functions of Parts36
- Screen Area: Names and Functions of Parts46
- Rear Panel: Names and Functions of Parts60
Setting Measurement Conditions65
- Initializing Parameters66
- Setting Channels and Traces67
- Setting the System Z075
- Setting Stimulus Conditions76
- Selecting Measurement Parameters86
  - Definition of S-Parameters86
  - Setting up S-Parameters86
- Selecting a Data Format87
- Setting the Scales91
- Setting Window Displays94
Calibration99
- Measurement Errors and Their Characteristics100
  - Drift Errors100
  - Random Errors100
  - Systematic Errors101
- Calibration Types and Characteristics105
- Checking Calibration Status108
  - Execution Status of Error Correction for each Channel108
  - Execution Status of Error Correction for each Trace108
  - Acquisition Status of Calibration Coefficient for each Channel109
- Selecting Calibration Kit111
- Setting the Trigger Source for Calibration112
- OPEN/SHORT Response Calibration (Reflection Test)113
  - Procedure113
- THRU Response Calibration (Transmission Test)116
  - Procedure116
- 1-Port Calibration (Reflection Test)119
  - Procedure120
- Enhanced Response Calibration121
  - Procedure122
- Full 2-Port Calibration124
  - Procedure125
- Full 3-Port Calibration127
  - Procedure128
- Full 4-Port Calibration130
  - Procedure131
- Ecal (Electronic Calibration)133
  - 1-Port Calibration Using a 2-Port Ecal Module133
  - Full 2-Port Calibration Using the 2-Port Ecal Module134
  - Unknown Thru Calibration136
  - Turning off Ecal Auto-Detect Function137
- Full 3-Port and Full 4-Port Calibration Using 2-Port Ecal138
  - Operational Procedure138
- Calibration Using 4-Port Ecal141
  - Operational Procedure141
- 2-Port TRL Calibration143
  - Operational Procedure144
- 3-Port TRL Calibration146
  - Operational Procedure147
- 4-Port TRL Calibration150
  - Operational Procedure151
- Simplified Calibration154
  - Simplified Full 3/4-Port Calibration154
  - Simplified 3/4-Port TRL Calibration155
- Partial Overwrite157
  - Procedure157
  - Improving Accuracy of Measurement Using Partial Overwrite (Thru Calibration) Along with Ecal158
- Unknown Thru Calibration159
  - Procedure159
- Calibration between Ports of Different Connector Types161
  - Operating Procedure162
- Adapter Characterization166
  - Concept167
  - How to Execute Adapter Characterization168
  - Execution Procedure of Characterization for Test Fixture Using Probe171
- Adapter Removal-Insertion173
  - About Adapter Removal173
  - About Adapter Insertion175
  - Procedure for Adapter Removal / Insertion176
- User-Characterized Ecal177
  - Precautions to Take in Using VBA Macros177
  - Storing User Characteristics to the Ecal Module178
  - Backup and Recovery of Ecal Module's Built-In Flash Memory182
  - Executing User-Characterized Ecal183
- Confidence Check on Calibration Coefficients Using Ecal185
  - Operational Procedure185
- Changing the Calibration Kit Definition187
  - Definitions of Terms188
  - Defining Parameters for Standards189
  - Redefining a Calibration Kit191
  - Example of Defining the TRL Calibration Kit194
  - Setting Options for TRL Calibration196
  - Setting a Media Type for the Calibration Kit197
  - Saving and Loading Definition File of Calibration Kit198
  - Default Settings of Pre-Defined Calibration Kits199
- Specifying Different Standard for each Frequency208
  - Defining Different Standard for each Frequency Band208
  - Defining Standard for each Subclass209
  - Disabling Standard Defined for a Subclass210
  - Notes on How Frequency Ranges Are Dealt When Using Subclasses211
- Power Calibration214
  - Turning on or off Power Level Error Correction214
  - Preparing Power Meter and Sensor215
  - Selecting Target Port of Error Correction221
  - Setting Loss Compensation221
  - Setting a Tolerance for Power Calibration224
  - Measuring Calibration Data224
- Receiver Calibration226
  - Turning ON/OFF Receiver Error Correction226
  - Selecting Target Port for Error Correction227
  - Measuring the Calibration Data227
- Vector-Mixer Calibration229
  - Overview of Vector-Mixer Calibration229
  - Measured Mixer230
  - Calibration Mixer (with if Filter)230
  - Characterizing Calibration Mixer (with if Filter)230
  - Characterizing Procedure for Calibration Mixer (with if Filter)231
  - How to Execute Characterization of Calibration Mixer232
  - Characterizing Calibration Mixer (with if Filter) for Balance Mixer Measurement236
  - How to Execute Characterization236
- Scalar-Mixer Calibration239
  - Confirming Calibration Status240
  - Operational Procedure (When Using Mechanical Calibration Kit)241
  - Operational Procedure (When Using Ecal Module)244
Making Measurements247
- Setting up the Trigger and Making Measurements248
- Setting the Point Trigger251
  - Procedure to Set the Point Trigger251
- Setting the Low-Latency External Trigger Mode252
  - Procedure to Set the Low-Latency External Trigger252
  - External Trigger Delay Time and Point Trigger Interval253
- Setting the Averaging Trigger Function255
  - Using the Averaging Trigger Function255
- Executing a Trigger Only for Active Channel256
  - Procedure to Set the Range256
Data Analysis257
- Analyzing Data on the Trace Using the Marker258
- Searching for Positions that Match Specified Criteria269
- Determining the Bandwidth of the Trace (Bandwidth Search)276
  - Executing a Bandwidth Search276
- Determining the Mean, Standard Deviation, and P-P of the Trace278
  - Displaying Statistics Data278
- Comparing Traces/Performing Data Math279
  - Performing Data Math Operations279
- Performing Parameter Conversion of Measurement Results281
  - Operational Procedure281
- Using the Equation Editor283
Fixture Simulator287
- Overview of Fixture Simulator288
- Extending the Calibration Plane Using Network De-Embedding291
  - Using the Network De-Embedding Function291
- Converting the Port Impedance of the Measurement Result292
  - Converting the Port Impedance292
- Determining Characteristics after Adding a Matching Circuit293
  - Using the Matching Circuit Function293
- Obtaining Characteristics after Embedding/De-Embedding 4-Port Network296
  - Operational Procedure297
- Evaluating Balanced Devices (Balance-Unbalance Conversion Function)299
- Converting Reference Impedance of Balanced Port306
  - Converting Port Reference Impedance in Differential Mode307
  - Converting Port Reference Impedance in Common Mode307
- Determining the Characteristics that Result from Adding a Matching Circuit to a Differential Port309
- Example of Using Fixture Simulator312
Frequency-Offset Measurement (Option 008)317
- Overview318
  - Overview of Frequency-Offset Measurement318
- Measurement of Mixers319
- Measurement of Harmonic Distortion332
Analysis in Time Domain (Option 010)337
- Overview338
- Transformation to Time Domain340
Data Output357
- Saving and Recalling Instrument State358
Limit Test379
- Limit Test380
- Ripple Test389
- Bandwidth Test396
Optimizing Measurements399
- Expanding the Dynamic Range400
  - Lowering the Receiver Noise Floor400
- Reducing Trace Noise402
  - Turning on Smoothing402
- Improving Phase Measurement Accuracy404
- Setting Port Extensions and Loss Values407
- Reducing Measurement Error in High Temperature Environments415
  - Procedure415
- Improving Measurement Throughput416
- Performing a Segment-By-Segment Sweep (Segment Sweep)421
Setting and Using the Control and Management Functions431
- Setting the GPIB432
  - Setting Talker/Listener GPIB Address of E5070B/E5071B432
  - Setting System Controller (USB/GPIB Interface)432
- Setting the Internal Clock435
Controlling E5091A479
- Connecting E5070B/E5071B and E5091A480
- Calibration488
- Performing Measurement489
  - Trigger State and Switching the Setting of the E5091A489
  - Operation489
- Connecting Two E5091As490
Measurement Examples491
- Measuring the SAW Bandpass Filter Using the Segment Sweep492
  - Evaluation Steps492
  - Determine the Segment Sweep Conditions493
?1. Determine the Segment Sweep the Segment Sweep Conditions Are Determined According to the494
?2. Create a Segment Sweep Table” the Segment Sweep Conditions Are Entered in the E5070B/E5071B.494
Conditions” on Page 487 Characteristics of the DUT.494
- Create a Segment Sweep Table494
- Select the Segment Sweep as the Sweep Type496
- Execute the Calibration496
- Connect the DUT497
- Execute the Measurement497
- Define the Setup for Display497
?4. Execute the Calibration” on a 2-Port Ecal Is Performed between the Test Ports Connecting the496
Sweep Type” on Page 490496
?3. Select the Segment Sweep as the the Segment Sweep Is Selected as the Sweep Type.496
?7. Define the Setup for Display” on the Choice Is Made between Frequency Base and Order Base as the497
?6. Execute the Measurement” on a Trigger Is Applied to Perform the Measurement.497
?5. Connect the DUT” on Page 491 the DUT Is Connected.497
- Evaluating a Duplexer499
- Measuring the Deviation from a Linear Phase511
- Measuring an Unbalanced and Balanced Bandpass Filter515
Specifications and Supplemental Information539
- Definitions540
- Corrected System Performance541
- Uncorrected System Performance546
- Test Port Output (Source)547
- Test Port Input549
- General Information553
- Measurement Throughput Summary561
- Measurement Capabilities564
- Source Control565
- Trace Functions565
- Data Accuracy Enhancement566
- Storage567
- System Capabilities567
- Automation568
Measurement Accessories569
- Test Port Cables570
Information on Maintenance581
- Backing up the Data582
- Manual Changes589
  - Manual Changes590
Troubleshooting613
- Troubleshooting614
List of Default Values635
- List of Default Values, Save/Recall Settings, and Backup Settings636
Softkey Functions651
- E5070B/E5071B Menu (Top Menu)652
- Analysis Menu653
- Average Menu668
- Calibration Menu669
- Display Menu694
- Format Menu698
- Macro Setup Menu699
- Marker Menu701
- Marker Function Menu703
- Marker Search Menu704
- Measurement Menu707
- Measurement Menu (Balance Measurement, SE-Bal)709
- Measurement Menu (Balanced Measurement, Bal-Bal)710
- Measurement Menu (Balanced Measurement, SE-SE-Bal)712
- Preset Menu714
- Save/Recall Menu715
- Scale Menu719
- Stimulus Menu720
- Sweep Setup Menu721
- System Menu724
- Trigger Menu731
General Principles of Operation733
- System Description734
- Data Processing736
Replacing the 8753ES with the E5070B/E5071B741
- Important Functional Differences742
- Comparing Functions751

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