Maintenance Commands
555-233-143
7-426 Issue 1 May 2002
Parameters
Error Messages
If the format for the board location is incorrect, the following error message will be
displayed:
Port/Board invalid
If the PN in which the specified board resides is not available, the following
message will be displayed:
PN is not available
location A location represents the physical position of the board to be
tested. For standard cabinets a location is entered as UUcSS
where “UU” represents the cabinet number, “c” represents the
carrier, and “SS” represents the slot position. A 1-digit cabinet
(1-3) is entered with or without a leading zero (0).
cpe-loopback-jack-test-begin
1
[number-of-bits bit-pattern]
1. The test will abort if the busyout command has not been set
For TN464F or TN767E or later suffix DS1 boards, this causes a
long-duration loopback test to be setup through the CPE
(customer-premises equipment) loopback jack. The command
allows you to specify a loop-up code for the CPE loopback jack if
it differs from the default of 0x47F. Specify the number-of-bits
in the loop-up code as well as the actual bit-pattern (in
hexadecimal).
far-csu-loopback-test-begin
1
For TN464F or TN767E or later suffix DS1 boards, this causes a
long-duration loopback test to be setup through the far-end CSU
(channel service unit).
one-way-span-test-begin
1
For TN464F or TN767E or later suffix DS1 boards, this begins
execution of a long-duration one-way span test.
end-loopback/span-test For TN464F or TN767E or later suffix DS1 boards, this
parameter terminates long-duration one-way span and loopback
testing.
inject-single-bit-error For TN464F or TN767E or later suffix DS1 boards, this
parameter causes a single bit error to be sent within an active
framed 3-in-24 test pattern used in long-duration loopback and
span testing.
ds1/csu-loopback-tests For TN464F or TN767E or later suffix DS1 boards, this
parameter executes the following loopback tests: DS1 Board
LoopBack, CSU Module Equipment LoopBack, and CSU Module
Repeater LoopBack. These tests are performed sequentially for
a short duration each, and individual PASS/FAIL/ABORT test
results are reported following each test.