Section 7. Installation
• When testing and troubleshooting fast measurements, the following
Status table registers may provide useful information:
o SkippedScan (p. 550)
o
MeasureTime (p. 544)
o
ProcessTime (p. 547)
o
MaxProcTime (p. 544)
o
BuffDepth (p. 537)
o
MaxBuffDepth (p. 544)
• When the number of Scan()/NextScan BufferOptions is exceeded, a
skipped scan occurs, which means a measurement was missed.
• Bursts have a duty cycle less than 100%. Assuming no other
measurement instructions are present in the program, each burst occurs at
the beginning of the Scan() Interval. During the rest of the scan, the
CR800 catches up on overhead tasks and processes data stored in buffers.
• If you wish to account for the time needed in the Scan()/NextScan
Interval, consider the following two points:
o Status table MeasureTime
(p. 544) field reports the measurement time
that occupies the Scan()/NextScan Interval. MeasureTime includes
time needed to make measurements inside and outside
SubScan()/NextSubScan.
o NextScan needs 100 µs to run
• One Scan()/NextScan buffer holds the raw measurements made in one
main scan, inside and outside the sub-scan.
For example, one execution of the following code sequence stores 30000
measurements in one buffer:
'Scan(Interval, Units, BufferOption, Count)
Scan(40,Sec,3,0)
SubScan(2,mSec,10000)
VoltSe(Measurement(),3,mV5000,[U6]1,False,150,250,1.0,0)
NextSubScan
NextScan
• You can dwell burst more than one channel with the same program by
adding a voltage measurement instruction for each channel to be
measured. Channels will be measured in series.
• The following points apply to cluster burst measurements:
o Measure smaller clusters for faster speeds.
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