Mitsubishi Electric MELSEC iQ-R Series - Performing a 32-Bit Test

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6 BASIC INSTRUCTIONS
6.4 Bit Processing Instructions
Performing a 32-bit test
DTEST(P)
These instructions extract the 'n'th bit in the specified double-word device.
■Execution condition
Setting data
■Description, range, data type
■Applicable devices
Ladder ST
ENO:=DTEST(EN,s1,s2,d);
ENO:=DTESTP(EN,s1,s2,d);
FBD/LD
Instruction Execution condition
DTEST
DTESTP
Operand Description Range Data type Data type (label)
(s1) Device where the extract target bit data is stored  32-bit signed binary ANY32
(s2) Extract target bit position 0 to 31 16-bit unsigned binary ANY16
(d) Device for storing the extracted bit data  Bit ANY_BOOL
EN Execution condition  Bit BOOL
ENO Execution result  Bit BOOL
Operand Bit Word Double word Indirect
specification
Constant Others
X, Y, M, L,
SM, F, B, SB,
FX, FY
J\ T, ST, C, D, W,
SD, SW, FD, R,
ZR, RD
U\G, J\,
U3E\(H)G
Z LT, LST,
LC
LZ K, H E $
(s1)         
(s2)         
(d)         
RnCPU
RnENCPU
RnSFCPU RnSFCPURnPCPURnPCPU
(Standard) (Safety)
(Redundant) (Process)
(s1) (s2) (d)
EN ENO
ds1
s2