Hioki 8847 - 3.5.3 Logic Channel

3.4 Setting Measurement Configuration
41
3
Chapter 3 Measurement Procedure
Set measurement conditions as follows.
By calling up the Waveform screen and then using the Settings window to make basic settings, you
can immediately verify the effect of settings on the waveform. Basic settings can also be made by
calling up the Status screen and selecting the [Status] sheet.
Select the function according to the measurement and recording target.
3.4 Setting Measurement Configuration
Settings window
( p.41)
Timebase
setting
(Sampling
rate)
(
 p.43)
Recording
Length
(Number of
divisions)
(
 p.46)
Press this key.
Opening the Settings window
3.4.1 Measurement Function
Procedure
To open the screen: Press the DISP key → Waveform screen
Move the cursor to the function item (topmost field in the
settings window).
Select
MEMORY (default setting)/ RECORDER/ X-Y
RECORDER/ FFT
This function is most suitable for oscilloscope-type measurements,
such as instantaneous waveforms and transient phenomena.
Trigger functions and calculation functions can be used.
This function is suitable for use instead of pen recorders and pen oscil-
loscopes, to record long-term fluctuations and create records for
observing slow phenomena.
Real-time printing of data is possible.
An endless X-Y waveform can be displayed.
Pen up/down operation as in an X-Y pen recorder is possible.
See: "Chapter 4 X-Y Recorder Function" (
 p.59)
Analyze the frequency.
Various types of spectrum and octave analysis can be performed.
See: "Chapter 13 FFT Function" ( p.207)