R&S
®
CMW 500 WCDMA Applications
WCDMA Command Reference
Operating Manual 1202.3986.32 – 03 350
FETCh:WCDMa:MEAS<i>:MEValuation:TRACe:EVMagnitude:RMS:AVERage?
FETCh:WCDMa:MEAS<i>:MEValuation:TRACe:EVMagnitude:RMS:MAXimum?
READ:WCDMa:MEAS<i>:MEValuation:TRACe:EVMagnitude:RMS:CURRent?
READ:WCDMa:MEAS<i>:MEValuation:TRACe:EVMagnitude:RMS:AVERage?
READ:WCDMa:MEAS<i>:MEValuation:TRACe:EVMagnitude:RMS:MAXimum?
Returns the values of the RMS EVM traces for up to 120 slots. Each value is averaged
over a half slot or a full slot, depending on the measurement period
(CONFigure:WCDMa:MEAS<i>:MEValuation:MPERiod:MODulation). The
results of the current, average and maximum traces can be retrieved.
Returned values
<Reliability>, Reliability indicator
<EVM 1>,
...,
<EVM 120/240>
RMS
EVM trace results: 120 values for a "full slot measurement"
and 240 values for a "half slot measurement"
Range: 0 % to 100 %
Def. unit: %
Example See Performing Single Shot Measurements
Characteristics Firmware version V1.00
SCPI: Query only
For additional information concerning syntax elements and returned values refer to
Multi Evaluation Measurement Commands.
FETCh:WCDMa:MEAS<i>:MEValuation:TRACe:EVMagnitude:RMS:SDEViation?
READ:WCDMa:MEAS<i>:MEValuation:TRACe:EVMagnitude:RMS:SDEViation?
Returns the standard deviation EVM trace values for up to 120 slots. Each standard
deviation is calculated from all "Current" RMS values of a half slot or a full slot
measured since the start of the measurement. This trace can not be displayed at the
GUI.
Returned values
<Reliability>, Reliability indicator
<Std Dev 1>,
...,
<Std Dev 120/240>
EVM standard deviation results: 120 values for a "full slot
measurement" and 240 values for a "half slot measurement"
Range: 0 % to 50 %
Def. unit: %
Example See Performing Single Shot Measurements
Characteristics Firmware version V1.00
SCPI: Query only
For additional information concerning syntax elements and returned values refer to
Multi Evaluation Measurement Commands.
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