5.41
Date Code 20130214 Instruction Manual SEL-2414 Transformer Monitor
Metering and Monitoring
Monitoring
Although the element processes all values each cycle, event duration (Duration
column) is reported in seconds with processing interval resolution. (If the event
duration is equal to or greater than 136 seconds (60 Hz) or 163 seconds (50 Hz),
the element appends a “+” to the time value).
IA, IB and IC show the maximum primary current for each phase, with a
maximum of 100,000 A primary.
A, B and C show the amount (percent increase) of the present fault for each
phase. Alarm shows those phase(s) that were in the alarm state at the end of the
through-fault event.
Table 5.19 shows events report messages and the reason why these messages may
appear in the events report.
Use the TFE A command to list all the stored through-fault events (not only the
last 20 events) since the monitor was last reset. To list a particular number of
through-fault events, enter the TFE n command (n = 1 to 500).
To clear event accumulated data, and all event records, use either the TFE C
(clear) or TFE R (reset) command. Both commands have the same result. Note
that when you change the ETHRFLT setting, the device also clear the data and
records, i.e., it has the same effect as the TFE C or TFE R command.
Use the TFE P command to preload or change the values of the through-fault
event accumulated data.
Analog Signal
Profiling
Use the analog signal profiling function to record and track values of as many as
32 analog channels. This function provides human-readable data in ASCII format
(PRO command) and machine readable data in CASCII format (CPR command)
that is compatible to import directly into applications like spreadsheets. Specify
analog quantities for profiling with the SPLIST1 and SPLIST2 Report settings
(see Section 6: Settings for more information).
Signal Profile Settings
Enter up to 16 analog quantities, separated by spaces or commas, into either
SPLIST1 or SPLIST2 settings, for a total of 32 analog quantities. Choose from
the analog quantities in Appendix I: Analog Quantities. Table 5.20 shows the set-
tings for the Signal Profile List.
Table 5.19 Through-Faults Events Report Messages
Message Cause
Invalid Data The accumulated data are corrupt.
Through Fault Event Monitor
Disabled
The ETHRFLT setting is NA, or evaluates to logical 0.
Too many events—Data Lost The memory is full.
Through Fault Event Buffer
Empty
There are no event records in the nonvolatile memory
Memory resources are low;
check for activity on other ports
There is insufficient memory to display the event
records
IMPORTANT NOTE: All stored
signal data are lost when changing
either SPLIST1 or SPLIST2 settings.
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