10.2
SEL-2414 Transformer Monitor Instruction Manual Date Code 20130214
Testing and Troubleshooting
Functional Testing
Output Verification
For each output contact, set the input to Logic 1. This causes the output contact to
close. For example, setting OUT101 = 1 causes the output OUT101 contact to close.
Repeat the process for all contact outputs.
Make sure that each contact closure does what you want it to do in the annuncia-
tion, control, or trip circuit associated with that contact closure.
Meter Verification
Verify that the device is correctly measuring current and voltage (if included) by
comparing the device meter readings to separate external meters.
EVENT Command
The device generates a 15- or 64-cycle event report in response to faults or distur-
bances. Each report contains current and voltage information, and input/output
contact information. If you question the device response or your test method, use
the event report for more information. The EVENT command is available at the
serial ports. See Section 9: Analyzing Events.
SER Command
The device provides a Sequential Events Recorder (SER) event report that time-
tags changes in device element and input/output contact states. The SER provides
a convenient means to verify the pickup/dropout of any element in the device.
Table 7.41 shows the SER commands to view and manage the reports. The SER
command is available at the serial ports.
TARGET Command
Use the TARGET command to view the state of device inputs, outputs, and ele-
ments during a test. The TAR command displays the status of front-panel target
LEDs or Device Word bits, The elements are represented as Device Word bits
and are listed in rows of eight, called Device Word rows. All Device Word rows
are described in Appendix H: Device Word Bits, as shown in Table 7.49. The
TARGET command is available at the serial ports and the front panel.
Low-Level Test Interface
The SEL-2414 has a low-level test interface on the current (4 CT) and voltage
(3 AVI) input printed circuit boards. You can test the device in either of two
ways: conventionally, by applying ac signals to the device inputs or by applying
low magnitude ac voltage signals to the test interface on the printed circuit
boards.
The 3 ACI/3 AVI card is not configured for low level test interface support.
A 3 ACI/3 AVI card with the low level test interface support is available. See the
I/O Card ordering document.
The SEL-RTS Low-Level Device Test System can be used to provide the signals
to test the device. Figure 10.1 shows the Test Interface connectors.
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