Sel 2414 - TFE (Through-Fault Event Report)

7.27
Date Code 20130214 Instruction Manual SEL-2414 Transformer Monitor
Communications
ASCII Commands
The elements are represented as Device Word bits and are listed in rows of eight,
called Device Word rows. All Device Word rows are described in Appendix H:
Device Word Bits. Device Word bits are used in SEL
OGIC control equations. The
TAR command does not remap the front-panel target LEDs, as is done in some
previous SEL products.
TFE (Through-Fault
Event Report)
The TFE command displays the following data for each individually recorded
through-fault event:
➤ Date and time of the through fault
➤ Duration (seconds) of the through fault
➤ Maximum current (Amps primary) for each monitored current
input
The following cumulative values (updated for each new through-fault event) are
also displayed:
➤ Through-fault count
➤ Simple I
2
t calculation for each monitored current input
There are various choices for the TFE command, listed briefly below. Refer to
Section 5: Metering and Monitoring for a complete description of the through-
fault event reports:
TAR n k Show Device Word row number n (0–103) and head-
ing, and repeat the status (0 or 1) of the eight Device
Word bits in row n k times (1–32767). See
Appendix H: Device Word Bits for the Device Word bit
table.
1
TAR R Displays Device Word row 0. 1
Table 7.49 TAR Command Definitions (Sheet 2 of 2)
Command Description Access Level
Table 7.50 TFE Command Choices
Command Description Access Level
TFE Displays cumulative and individual through-fault event
data.
The twenty (20) most recent individual events are dis-
played.
1
TFE A Displays cumulative and individual through-fault event
data.
All the most recent individual events are displayed, up
to 1200.
1
TFE C Clears/resets cumulative and individual through-fault
event data.
2
TFE n Displays cumulative and individual through-fault event
data. The n most recent individual events are dis-
played, where n = 1 to 1200.
1
TFE P Preloads cumulative through-fault event data. 2
TFE R Clears/resets cumulative and individual through-fault
event data.
2