Sel 2414 - Page 233

10.11
Date Code 20130214 Instruction Manual SEL-2414 Transformer Monitor
Testing and Troubleshooting
Self-Test
NOTE: After a device failure, all
digital output contacts revert to their
de-energized state, i.e., all normally
open contacts (a contacts) open and
all normally closed contacts
(b contacts) close.
Table 10.11 lists hardware self-tests. In the Alarm Status column, Latched indi-
cates that HALARM is continuously asserted, Not Latched indicates that
HALARM is pulsed for 5 seconds, and NA indicates that HALARM is not
asserted. All hardware self-test failures generate a front-panel message that is
automatically sent to the serial port. All hardware self-test failures (Latched entry
in Alarm Status column) disable the device.
Tab l e 1 0.11 Devi ce Se l f-Test s (Sheet 1 of 2)
Self-Test Description
Monitoring
Disabled
on Failure
Alarm
Status
Status
Command
Front-Panel
Message
Mainboard FPGA
(power up)
Fail if mainboard Field Programmable
Gate Array does not accept program
Yes Latched FPGA
OK/FAIL
Status Fail
FPGA Failure
Mainboard FPGA
(run time)
Fail on lack of data acquisition interrupts Yes Latched FPGA
OK/FAIL
Status Fail
FPGA Failure
GPSB (back-plane)
communications
Fail if GPSB is busy on entry to
processing interval
Yes Latched GPSB
OK/FAIL
Status Fail
GPSB Failure
Front-Panel HMI
(power up)
Fail if ID registers do not match expected
or if FPGA programming is unsuccessful
No Not
Latched
HMI
OK/WARN
External RAM (power up) Performs a read/write test on system
RAM
Yes Latched RAM
OK/FAIL
Status Fail
RAM Failure
External RAM (run time) Performs a read/write test on system
RAM
Yes Latched RAM
OK/FAIL
Status Fail
RAM Failure
Internal RAM (power up) Performs a read/write test on system
CPU RAM
Yes Latched RAM
OK/FAIL
Status Fail
RAM Failure
Internal RAM (run time) Performs a read/write test on system
CPU RAM
Yes Latched RAM
OK/FAIL
Status Fail
RAM Failure
Code Flash (power up) SELBOOT qualifies code with a
checksum
NA NA NA
Code Flash (run time) Checksum is computed on the entire
code base
Yes Latched ROM
OK/FAIL
Status Fail
ROM Failure
Data Flash (power up) Checksum is computed on critical data Yes Latched NON_VOL
OK/FAIL
Status Fail
Non_Vol Fail-
ure
Data Flash (run time) Checksum is computed on critical data Yes Latched NON_VOL
OK/FAIL
Status Fail
Non_Vol Fail-
ure
Critical RAM (settings) Performs a checksum test on the active
copy of settings
Yes Latched CR_RAM
OK/FAIL
Status Fail
CR_RAM Fail-
ure
Critical RAM (run time) Verifies instruction (code) matches Flash
image
Yes Latched CR_RAM
OK/FAIL
Status Fail
CR_RAM Fail-
ure
Clock Battery Check battery voltage level No Not
Latched
BATT
OK/WARN
Clock Chip Unable to communicate with clock or
fails time keeping test
No Not
Latched
CLOCK
OK/WARN
Clock Chip RAM Clock chip static RAM fails No Not
Latched
CLOCK
OK/WARN
Internal RTDs
a
(run time)
Fail if the RTD card has a failed power
supply, there is an open RTD, or there is
a shorted RTD
No Latched INTRTD
OK/FAIL
Internal RTDs/TC
a
(run time)
Fail if the RTD card has a failed power
supply, there is an open RTD, or there is
a shorted RTD
No Latched INTEMP
OK/FAIL