7-8 Routine maintenance
Note: This section describes maintenance of the electron ionization (EI) inner
source chamber assembly. Maintenance of the chemical ionization (CI) inner
source assembly is similar, although it has two ion exit plates instead of one,
and no repeller or trap and associated components.
Clean the inner source chamber assembly when these conditions apply:
• It is visibly fouled.
• GC and sample-related causes for decreased signal intensity have been
dismissed.
JCeramic spacer
K Locating dowel (shouldered)
L Locating dowel (plain)
MCeramic spacer
NIon block
OTrap
P Trap securing nut
Q Washer
R Trap contact
SCeramic spacer
TCeramic spacer
UCeramic spacer
V Repeller contact
W Repeller contact ceramic spacer
X Repeller contact securing nut
Y Washer
Z Repeller shaft
AA Ceramic spacer
AB Ceramic spacer
AC Ceramic spacer
AD Repeller
Key to inner source chamber assembly components (Continued)
Item Description
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