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Kikusui TOS9301 - Starting a Test; Connecting the Test Leads to the EUT

Kikusui TOS9301
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152 User’s Manual TOS93 Series
Touch Current Test
Starting a Test
We recommend that you perform a pre-test inspection (p.281) before executing a test.
Connecting the test leads to the EUT
Connect the test leads to the test location of the EUT. For details on connecting the power supply line for
the product and EUT and connecting test leads to the product, see “Connection for Leakage Current
Tests” (p.41).
Th
e test locations of the EUT
in touch current tests vary depending on the test condition settings of “Probe
connection destination” (p
.139) and “Single fault mode (Condition)” (p.138) and the appliance class of the
EUT. The following table shows where to connect the test lead connected to the A te
rminal (test lead A)
and that connected to the B terminal (test lead B).
Test condition Where to connect the test leads
Probe Condition Class I instrument or Class 0I instrument Class II instrument
Enc-Liv Normal Test lead A to the enclosure not connected
to protective ground (example 1).
Test lead A to the enclosure.
Enc-Neu
Enc-PE Normal Test lead A to the enclosure (example 3). Test lead A to the enclosure.
Fault Neu
Fault PE Test lead A to the enclosure. If 110% OUT is
turned on, connect test lead 110% to the
signal I/O section not connected to
protective ground.
Enc-Enc Normal Test lead A and B to two insulated locations
on the enclosure not connected to
protective ground (example 2).
If 110% OUT is turned on, connect test lead
110% to the signal I/O section not
connected to protective ground (example 4).
Test lead A and B to two insulated
locations on the enclosure. If 110%
OUT is turned on, connect test lead
110% to the signal I/O section not
connected to protective ground.
Fault Neu
Fault PE Test lead A and B to two insulated locations
on the enclosure not connected to
protective ground (example 2) or to the
enclosure not connected to protective
ground and enclosure connected to
protective ground. If 110% OUT is turned
on, connect test lead 110% to the signal I/O
section not connected to protective ground
(example 4).

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