Olympus EPOCH 1000 Series - Gate Adjustment During Calibration; Figure 17-25 Wide Gate with Two Echoes Interfering

910-269-EN, Rev. B, June 2011
Calibrating the EPOCH 1000 Series (Phased Array Mode) 303
17.5 Gate Adjustment During Calibration
The wedge delay and sensitivity (gain) calibration procedures described in the
previous sections often require you to acquire either an amplitude or thickness
measurement from a single reflector across all focal laws. It is critical that while
acquiring this reflection during the calibration process, no other reflector of higher
amplitude enters the gated region. If other reflectors occur within the gated region
during either wedge delay or sensitivity (gain) acquisition, those other reflections can
interfere with the data being tracked by the instrument and can corrupt the
calibration process.
Figure 17-25 Wide gate with two echoes interfering
The EPOCH 1000 Series allows you to adjust the start position and/or width of gate 1
while acquiring data during a calibration procedure. This allows you to use a narrow
gate width to measure the amplitude/thickness of the desired calibration reflection for
one subset of focal laws. Then you reposition the gate to acquire the remaining
amplitude/thickness measurements from the same reflection at another subset of focal
laws.
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