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ST STM32F410 User Manual

ST STM32F410
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Page #264 background image
True random number generator (RNG) RM0401
264/771 RM0401 Rev 3
13.7 Entropy source validation
13.7.1 Introduction
In order to assess the amount of entropy available from the RNG, STMicroelectronics has
tested the peripheral using NIST SP800-22 rev1a statistical tests.
For more information on running this NIST statistical test suite, refer to STM32
microcontrollers random number generation validation using NIST statistical test suite
application note (AN4230), available on STMicroelectronics website.
13.7.2 Validation conditions
STMicroelectronics has tested the RNG true random number generator in the following
conditions:
RNG clock rng_clk= 48 MHz (CED bit = ‘0’ in RNG_CR register) and rng_clk= 400kHz
(CED bit=”1” in RNG_CR register)

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ST STM32F410 Specifications

General IconGeneral
BrandST
ModelSTM32F410
CategoryMicrocontrollers
LanguageEnglish

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