Electrical Characteristics
MC9S12G Family Reference Manual Rev.1.27
NXP Semiconductors 1231
In Table A-52 the timing characteristics for slave mode are listed.
A.16 ADC Conversion Result Reference
The reference voltage V
DDF
is measured under the conditions shown in Table A-53. The value stored in
the IFR is the average of eight consecutive conversions at T
j
=150 C and eight consecutive conversions at
T
j
=-40 C.
Table A-52. SPI Slave Mode Timing Characteristics
Conditions are 4.5 V < V
DD35
< 5.5 V junction temperature from –40C to T
Jmax
.
Num C Characteristic Symbol Min Typ Max Unit
1 D SCK Frequency
f
sck
DC — 14
f
bus
1 D SCK Period
t
sck
4—
t
bus
2 D Enable Lead Time
t
L
4— —
t
bus
3 D Enable Trail Time
t
T
4— —
t
bus
4 D Clock (SCK) High or Low Time
t
wsck
4— —
t
bus
5 D Data Setup Time (Inputs)
t
su
8— — ns
6 D Data Hold Time (Inputs)
t
hi
8— — ns
7D
Slave Access Time (time to data
active)
t
a
—— 20 ns
8 D Slave MISO Disable Time
t
dis
—— 22 ns
9 D Data Valid after SCK Edge
t
vsck
——
1
1
0.5t
bus
added due to internal synchronization delay
ns
10 D Data Valid after SS
fall
t
vss
——
1
ns
11 D Data Hold Time (Outputs)
t
ho
20 — — ns
12 D Rise and Fall Time Inputs
t
rfi
—— 9 ns
13 D Rise and Fall Time Outputs
t
rfo
—— 9 ns
Table A-53. Measurement Conditions
Description Symbol Value Unit
Regulator supply voltage V
DDR
5V
I/O supply voltage V
DDX
5V
Analog supply voltage V
DDA
5V
ADC reference voltage V
RH
5V
ADC clock
f
ADCCLK
2MHz
ADC sample time t
SMP
4 ADC clock cycles
Bus frequency f
bus
24 MHz
Junction temperature T
j
150 and -40 C
Code execution from RAM
To Next Page
Loading...
Need help?
General
