AMD AMD5K86 - TDI (Test Data Input)

AMD~
AMD5116 Processor Technical Reference Manual
18524BjO-Mar1996
5.2.50
Summary
Sampled
Details
5-128
TCK (Test Clock)
Input
TCK is the clock for boundary-scan testing using the Test
Access Port (TAP).
The processor always samples TCK, except while RESET or
INIT is asserted. The signal has an internal pullup resistor.
Data and state definition are clocked into the processor on the
rising edge of TCK. The outp'uts on TDO are driven valid on the
falling edge of TCK. When TCK stops on its falling edge, the
state of test latches in the processor are held.
Section 7.8 on page 7-19 summarizes the implementation of
TAP testing on the AMDS
K
86 processor. System logic should
tie TCK High if TAP testing is not implemented.
See the IEEE Standard Test Access Port and Boundary-Scan
Architecture (IEEE 1149.1) specification for details on how the
TAP signals and instructions are used for testing. The TAP is
often called the Joint Test Action Group (JTAG) port, after the
committee that proposed the IEEE TAP standard.
Bus Interface