AMD AMD5K86 - TDO (Test Data Output)

AMD~
18524B/O-Mar1996 AMD5J!16 Processor Technical Reference Manual
5.2.51 TDI (Test Data Input)
Summary
Sampled
Details
Signal Descriptions
Input
TDI carries input test data and instructions for testing on the
Test Access Port (TAP).
The processor samples TDI every rising TCK edge, but only
during the shiftJR and shifcDR states. TDI has an internal
pullup resistor.
TDI is always sampled, except while RESET or INIT is
asserted.
Instructions are shifted into the processor on TDI during the
shiftJR TAP state. Data are shifted into the processor on TDI
during the shifcDR TAP state.
See the IEEE Standard Test Access Port and Boundary-Scan
Architecture (IEEE
1149.1) specification for a description of
how the TAP signals and instructions are used for testing.
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