R&S FSL SENSe Subsystem
1300.2519.12 6.205 E-11
SENSe:LIST Subsystem
The commands of this subsystem are used for measuring the power at a list of frequency points with
different device settings. The measurement is always performed in zero span. A new trigger event is
required for each test point (exception: trigger FREE RUN).
The results are output as a list in the order of the entered frequency points. The number of results per
test point depends on the number of concurrently active measurements (peak/RMS/average). The
number of frequencies is limited to 100 entries.
Selection of concurrently active measurements and setting of parameters that are constant for the
whole measurement is performed via a configuration command ([SENSe<1|2>:]LIST:POWer:SET).
This also includes the setting for trigger and gate parameters.
Note: Settings that are not directly included in commands of this subsystem can be configured by
sending the corresponding commands prior to the SENSe:LIST Subsystem commands.
Please note that changes to the trigger level have to be executed in zero span in order to take
effect for the SENSe:LIST Subsystem commands.
The following subsystem is included:
• "SENSe:LIST:RANGe Subsystem" on page 6.210
Commands of the SENSe:LIST Subsystem
– [SENSe<1|2>:]LIST:POWer[:SEQuence]
– [SENSe<1|2>:]LIST:POWer:RESult?
– [SENSe<1|2>:]LIST:POWer:SET
– [SENSe<1|2>:]LIST:POWer:STATe
Further information
– More details on the SENSe:LIST Subsystem
More details on the SENSe:LIST Subsystem
The following setting parameters can be selected independently for each frequency point:
• analyzer frequency
• reference level
• resolution filter
• resolution bandwidth
• video bandwidth
• measurement time
• detector
The commands of this subsystem can be used in two different ways:
• Instrument setup, measurement and querying of the results in a single command line. With this
method, there is the least delay between the measurement and the result output. However, it
requires the control computer to wait for the response from the instrument.
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