4200-900-01 Rev. K / February 2017 Return to Section Topics 3-67
Model 4200-SCS User’s Manual Section 3: Common Device Characterization Tests
used. Note that the PIV-Q package is not compatible with the 4225-PMU or
4225-RPM. See Section 16 of the Reference Manual for information on using the
PMU and RPM for Pulse I-V testing.
What is the PIV-Q package
The PIV-Q package is an optional factory-installed kit to the 4200-SCS. The focus
for the PIV package is testing RF FETs that exhibit self-heating or charge trapping
effects (also called dispersion).
The PIV-Q package consists of:
• 4205-PG2 Dual channel voltage pulse generator (quantity: three).
• 4200-SCP2HR Dual channel oscilloscope.
• 4205-PCU Pulse Combiner Unit to create one higher power pulse channel for the
DUT drain by combining the four pulse channels from two 4205-PG2 cards.
• Pulse IV Interconnect adapters and cabling.
• Pulse IV software - Projects and test routines for testing of RF FETs, including cable
compensation and load-line algorithms to provide DC-like sweep results.
Target applications and test projects
The PIV-Q package includes test projects that address the most common
parametric transistor tests:
•Vds-id
•Vgs-id
These tests are provided in both DC and Pulse modes, allowing correlation
between the two test methods. These tests and initialization steps for scope auto-
calibration and cable compensation are included in a single 4200 test project,
QPulse-IV-Complete.
There are two methods for performing DC IV sweeps.
• Use the SMUs to provide the DC source and measure: Vd-Id-DC, Vg-Id-DC.
Because SMU output impedance varies with the source and measure ranges, high
gain or high frequency DUTs may be difficult to test because of oscillation.
• Pulse IV instrumentation may also be used to provide DC-like IV sweeps. Using the
pulse source and measure hardware provides a fixed output impedance, which can
provide better DC test results on high gain or high frequency DUTs that are prone to
oscillation.
Use the desired pulse test and set the duty cycle from the typical low values up to
90 % to mimic a DC test by choosing a longer period, up to one second, with
appropriate pulse width and transitions.
NOTE For more information on how to use 4200-PIV-Q, refer to Application Note PA-956
Rev. B, 4200-PIV-Q Pulse IV Measurements for Compound Semiconductor and
LDMOS Transistors. This notes can be found on the 4200-SCS Complete Reference.
Also see Reference manual, QPulseIV-Complete project, page 12-18.
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