Keithley 4200-SCS User Manual

3-86 Return to Section Topics 4200-900-01 Rev. K / February 2017
Section 3: Common Device Characterization Tests Model 4200-SCS User’s Manual
NOTE To effectively transmit the higher frequency components of the typical pulse
(Segment ARB or Standard), a high bandwidth switch matrix should be used (for
example, Keithley Instruments Model 7174A or 7173-50).
Figure 3-67
Stress / measure test system
Segment ARB stressing
Figure 3-68 shows an example of how a DUT can be stressed using Segment
ARB
®
waveforms. During a stress phase, the matrix shown in Figure 3-67
connects the channels of the Keithley pulse card to the drain and gate of the DUT.
The pulse generator stresses the drain and gate by outputting Segment ARB
waveforms.
Two 4200-SMUs (SMU1 and SMU2) are connected to the substrate and source
terminals of the DUT, and are set to 0 V to effectively ground the terminals.
4200-SMU (1)
4200-SMU (2)
4200-SMU (3)
4205-PG2 Ch 1
4200-SCS
4205-PG2 Ch 2
Model 7174A Matrix Card (8 x 12)
Model 708A Switching Mainframe
A
B
C
D
E
F
G
H
12345 6789101112
Source
Drain
Gate
Substrate

Keithley 4200-SCS Specifications

General

Brand	Keithley
Model	4200-SCS
Category	Semiconductors
Language	English