Keithley 4200-SCS User Manual

3-26 Return to Section Topics 4200-900-01 Rev. K / February 2017
Section 3: Common Device Characterization Tests Model 4200-SCS User’s Manual
CVU Frequency Sweep (step)
Figure 3-23 shows an example of a FFMO window with CVU Frequency Sweep
(step) selected as the forcing function to measure Cp-Gp. The Sweeping test
mode must be selected for this test (see Figure 3-11).
Figure 3-23
Forcing Function: CVU Frequency Sweep (step)
When this test is run (see Figure 3-24), the following force-measure sequence
occurs:
1. The DC source goes to the PreSoak voltage of -1 V.
2. After the hold time, DC bias goes to 0 V.
3. After the system delay and the programmed delay, the 4210-CVU makes a measurement
for the 100 kHz frequency point. The AC signal is applied just before the start of the
measurement.
4. After another system delay and programmed delay, a measurement is performed for the
200 kHz frequency point.
5. DC bias goes to 1 V.
6. Steps 3 and 4 are repeated.
7. DC bias goes to 2 V.
8. Steps 3 and 4 are repeated.
The sweep delay, hold time and output disable are set from the ITM timing
window for sweeping.

Keithley 4200-SCS Specifications

General

Brand	Keithley
Model	4200-SCS
Category	Semiconductors
Language	English