4200-900-01 Rev. K / February 2017 Return to Section Topics 3-85
Model 4200-SCS User’s Manual Section 3: Common Device Characterization Tests
Use Copy and Paste as follows:
1. On the correct Device Stress Properties window, click Copy to copy the properties into the
buffer.
2. If pasting to a different site, select the site as shown in step 1 in Figure 3-59.
3. Use the Next Device or Prev Device button to display the properties window for the desired
device.
4. Click Paste to overwrite the device properties with the properties stored in the buffer.
Paste to All Sites: After copying the properties for the desired Device Stress
Properties window (as explained in step 1 above), click Paste to All Sites to
overwrite the device properties for all available sites.
Segment Stress / Measure Mode
NOTE The following supplemental information explains stress testing using the Segment
Stress / Measure Mode. This is similar to the basic Stress / Measure Mode, but
instead uses the Segment ARB pulse mode of a Keithley pulse card.
Segment Stress / Measure Testing consists of two phases:
• During a measure phase, the SMUs perform DC measurements on the DUT.
• During a stress phase, the Keithley pulse card provide stress using Segment ARB
®
waveforms, and the SMUs provide voltage bias and current limit. There are no
measurements performed during the stress phase.
NOTE Refer to Segment ARB stressing on page 3-86 for details about using Segment ARB
stressing to endurance test floating gate flash memory devices.
Figure 3-67 shows a typical stress / measure test system using a switch matrix to
automate the stress and measure phases of the test:
• During a measure phase, the switch matrix connects the SMUs that will perform the
DC measurements on the DUT. The Keithley pulse card is disconnected from the
DUT during a measure phase.
• During a stress phase, the switch matrix connects the pulse generator to the DUT. It
also connects SMUs that will be used for device pin grounding or biasing.
NOTE The Model 708A Switching Mainframe and Model 7174A Matrix Card shown in
Figure 3-67 are added to the 4200-SCS system from KCON. See the Reference
manual, Appendix B, Using KCON to add a switch matrix to the system and configure
its connections.
NOTE When using segment stress / measure mode with multiple pulse cards installed in a
4200-SCS, trigger connections must be made as shown in Figure 3-34. For further
information, see Reference manual, Pulse Source-Measure Concepts, page 11-1.
Specifically, refer to Trigger connections: Output synchronization and Multi-channel
synchronization with the Segment ARB Mode.
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