Keithley 4200-SCS User Manual

3-4 Return to Section Topics 4200-900-01 Rev. K / February 2017
Section 3: Common Device Characterization Tests Model 4200-SCS User’s Manual
How to perform an I-V test on my device
NOTE It is assumed that the reader of this section already has a basic understanding of the
4200-SCS software environment and terminology. Please review Model 4200-SCS
Software Environment, page 2-3 before proceeding to Section 3.
Default project overview
The Keithley Interactive Test Environment (KITE) default project contains the
most common I-V tests a typical user might perform on a regular basis. These
tests serve as examples and intended to be copied and modified to work for your
own devices. These default tests cover 4-terminal FETs, three terminal BJTs, two
terminal diodes, resistors, and capacitors.
The KITE project default should open automatically upon starting the KITE
application. If it does not, the default project can be found at
C:\S4200\kiuser\default\default.kpr.
When you open the default project in KITE, you see the tests in Figure 3-1.
Figure 3-1
Project Plan: Default

Keithley 4200-SCS Specifications

General

Brand	Keithley
Model	4200-SCS
Category	Semiconductors
Language	English