Keithley 4200-SCS User Manual

3-126 Return to Section Topics 4200-900-01 Rev. K / February 2017
Section 3: Common Device Characterization Tests Model 4200-SCS User’s Manual
The difference between the Flash-NAND and Flash-NOR are the typical pulse
widths and levels specific to the DUT type. The Flash-switch is a generic example
of the Flash testing described above, but adds support for an external Keithley
switch matrix.
NVM_examples
The NVM_Examples test uses one 4225-PMU, two 4225-RPMs and two SMUs to
characterize NAND flash, phase change memory and ferroelectric memory. For
additional information see the NVM Application Note link on the Applications page
of the 4200 Complete Reference.
Flash-NAND tests
Flash-NAND tests consist of the following tests:
• Program
•Erase
• Fast-Program-Erase
• SetupDC
•Vt-MaxGm
• Program-8
• Erase-8
• Fast-Program-Erase-8
NOTE The Flash-NAND project navigator is shown in Figure 3-101.
Figure 3-101
Flash-NAND project

Keithley 4200-SCS Specifications

General

Brand	Keithley
Model	4200-SCS
Category	Semiconductors
Language	English