Keithley 4200-SCS - Page 233

4200-900-01 Rev. K / February 2017 Return to Section Topics 3-127
Model 4200-SCS User’s Manual Section 3: Common Device Characterization Tests
Figure 3-102
Parameters for Program or Erase UTMs (using single_pulse_flash module)
Figure 3-103
Parameters for Fast Program-Erase pulse waveform (using double_pulse_flash module)
Program test – This test uses the partially pre-defined waveform shown in Figure
3-102 to program a flash memory device. The Definition tab for this test is shown
in Figure 3-104.
Figure 3-104
Flash-NAND project – Program definition tab
PostPulseDelaysPrePulseDelays
PulseVoltages
0V
PulseWidths
TransitionTimes
0V
PostPulse1Delays
0V
PrePulse 1Delays
Pulse1Voltages
0V
Pulse1Widths
TransitionTimesPulse 1
PostPulse2Delays
0V
PrePulse 2Delays
Pulse2Voltages
0V
Pulse2Widths
TransitionTimesPulse 2