4200-900-01 Rev. K / February 2017 Return to Section Topics 3-53
Model 4200-SCS User’s Manual Section 3: Common Device Characterization Tests
VdId_Pulse_DC_Family_pulseiv
Description The VdId_Pulse_DC_Family_pulseiv sweep is used to perform a Pulsed vs DC
Vd-Id sweep using the 4200-PIV-A package. This test is similar to a typical Vd-Id
but only two sources are used: one for the DUT Gate and one for the DUT Drain.
Pulsed Measurements are made with the 2-channel scope, 4200-SCP2.
To create a family of curves, choose an appropriate start and stop value for Vgs,
and a number of steps.
This routine can run the sweeps in three different ways: 1) DC only; 2) Pulse only;
3) Pulse and DC curves. This routine supports from one to 10 Vd-Id curves based
on up to 10 different Vgs values.
This routine also supports the 4200-PIV-A package using the 4200-RBT. For this
package, all test parameters and limits are given below, except the 4200-PIV-A
with the 4200-RBT has a max pulse width of 150 ns, not the 250 ns of the
4205-RBT.
All voltage levels specified below assume a 50 Ω DUT load.
Connection The source and body (well) of the DUT must be shorted together and connected to
the common low (outer shield) of the SMA cables on the AC+DC output of the
4205-RBT. The RBT connected to GateSMU (the RBT with the Power Divider)
should be connected to the gate. The RBT connected to DrainSMU should be con-
nected to the drain. Use either G-S-G probes for RF structures, or use DC probes
with the 4200-PRB-C adapter cables for DC structures.
Table 3-9
Return values for vdsid_pulseiv
Value Description
0
OK
-1 Invalid value for Vgs
-2 Invalid value for VdStart
-3 Invalid value for VdStop
-4 Invalid value for VdStep
-5 Invalid value for PulseWidth
-6 Invalid value for PulsePeriod
-7 Invalid value for AverageNum
-8 Invalid value for LoadLineCorr
-9 Array sizes do not match
-10 Array sizes not large enough for sweep
-11 Invalid VPUId
-12 Invalid GateSMU
-13 Invalid DrainSMU
-14 Unable to initialize PIV solution
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