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General| Type | Semiconductor Characterization System |
|---|---|
| Category | Semiconductors |
| Model | 4200-SCS |
| Manufacturer | Keithley |
| Voltage Range | ±200V |
| Minimum Voltage Resolution | 100 nV |
| Operating System | Windows |
| Measurement Capabilities | I-V, C-V, pulse, transient |
| Interface | GPIB, USB |
| Software | Keithley Test Environment (KTE) |
Document providing detailed instructions for operating the Model 4200-SCS.
Guidelines and warnings to ensure safe operation of the 4200-SCS and associated instrumentation.
Guidance on unpacking, shipment contents, environmental considerations, and system connections.
Introduction to Keithley Interactive Test Environment (KITE) and its capabilities.
Guide to performing I-V tests on devices, covering default project overview and specific test types.
Steps for performing C-V tests using KITE, including ITM configuration and terminal settings.
Methods for performing Pulse I-V testing using 4225-PMU or pulse packages like PIV-A and PIV-Q.
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