Keithley 4200-SCS User Manual

3-70 Return to Section Topics 4200-900-01 Rev. K / February 2017
Section 3: Common Device Characterization Tests Model 4200-SCS User’s Manual
Configuring the Subsite Setup tab
To set up cyclical testing, configure the Subsite Setup tab as shown in steps A
through E below.
Step A: Enable cycling
Figure 3-52
Enabling cycling
Step B: Choose the mode of cycling
Figure 3-53
Specifying the mode of cycling (Stress / Measure Mode or Cycle Mode)
NOTE In order to use the switching feature of 4225-RPMs during the transition from
measure to stress, ensure that the instruments connected to the RPMs are
configured in KCON (see Reference manual, Tools > Update DC Preamp and RPM
Configuration, page 7-9).
Step C1: Specify cycle timing; linear, log or list (stress / measure mode only)
Figure 3-54 explains how to set timing for the linear and log modes, while Figure
3-55 explains how to set timing for the list mode.
Note that cycling
cannot be configured
until it is enabled
What are your test
Only repetitive
cycling through
subsite tests:
no stressing of
devices
Tes t → Stress → Te s t → Stress →
Test ... cycles.
For example, Hot Carrier Injection
(HCI) or Negative Bias Temperature
Instability (NBTI) studies.

Keithley 4200-SCS Specifications

General

Brand	Keithley
Model	4200-SCS
Category	Semiconductors
Language	English