Keithley 4200-SCS User Manual

3-72 Return to Section Topics 4200-900-01 Rev. K / February 2017
Section 3: Common Device Characterization Tests Model 4200-SCS User’s Manual
Figure 3-55
Specifying timing (List)
Step C2: Specify number of cycles (cycle mode only)
Figure 3-56
Specifying the number of cycles
Step D: Set periodic test intervals (stress / measure mode, log timing only)
In the Periodic Test Interval (Log) area you can specify uniform, periodic
intervals at which to interrupt the stress to perform tests. These are in addition to
the intervals specified under Stress / Measure Cycle Times. Specify these
intervals as shown in Figure 3-57.
NOTE You can use the Periodic Test Interval (Log) area only if you select Log in the
Stress / Measure Cycle Times area (the Periodic Test Interval (Log) area is
disabled if you select Linear).
1) Select List.
2)Enter a Stress Time.
3)Click the Add button to add the stress time to the Stress Times list.
4)Repeat steps 2 and 3 to add more stress times to the list.
To remove a stress time, select the entry in the Stress Times list and click Remove.
If desired, specify a measurement delay (seconds) after each stress interval: to allow
each device to equilibrate before measuring its parameters.
Specify here the total number of no-stress (measurements-
only) cycles. Maximum number of cycles is 128.

Keithley 4200-SCS Specifications

General

Brand	Keithley
Model	4200-SCS
Category	Semiconductors
Language	English