Keithley 4200-SCS User Manual

3-124 Return to Section Topics 4200-900-01 Rev. K / February 2017
Section 3: Common Device Characterization Tests Model 4200-SCS User’s Manual
Memory projects
The Memory projects folder covers a variety of non-volatile memory testing. There
are tests for floating gate memory, phase change memory, and ferroelectric
memory. There are several projects for floating gate NAND and NOR testing
There are three types of flash memory projects:
• Initial Characterization
• Endurance
•Disturb
Each type of project has three different sets of defaults for common setups:
• NAND device (direct connect)
• NOR device (direct connect)
• Switch (using a Keithley 707A/708A switch matrix and compatible cards).
This results in the projects in the Projects\_Memory folder shown in Figure 3-100.
Figure 3-100
Project listing _Memory folder
There are three similar projects that provides the ability to send n pulses to the
DUT, then perform a V
T
sweep:
• Flash-NAND project
• Flash-NOR project
• Flash-Switch project
The pulses can be either a single pulse program or erase waveform, or the
combined program and erase waveform. Figure 3-101 shows the program and
erase tests for the Flash-NAND project. These tests allow investigation into

Keithley 4200-SCS Specifications

General

Brand	Keithley
Model	4200-SCS
Category	Semiconductors
Language	English