Keithley 4200-SCS User Manual

3-124 Return to Section Topics 4200-900-01 Rev. K / February 2017
Section 3: Common Device Characterization Tests Model 4200-SCS User’s Manual
Memory projects
The Memory projects folder covers a variety of non-volatile memory testing. There
are tests for floating gate memory, phase change memory, and ferroelectric
memory. There are several projects for floating gate NAND and NOR testing
There are three types of flash memory projects:
• Initial Characterization
• Endurance
•Disturb
Each type of project has three different sets of defaults for common setups:
• NAND device (direct connect)
• NOR device (direct connect)
• Switch (using a Keithley 707A/708A switch matrix and compatible cards).
This results in the projects in the Projects\_Memory folder shown in Figure 3-100.
Figure 3-100
Project listing _Memory folder
There are three similar projects that provides the ability to send n pulses to the
DUT, then perform a V
T
sweep:
• Flash-NAND project
• Flash-NOR project
• Flash-Switch project
The pulses can be either a single pulse program or erase waveform, or the
combined program and erase waveform. Figure 3-101 shows the program and
erase tests for the Flash-NAND project. These tests allow investigation into

Keithley 4200-SCS Specifications

General

Type	Semiconductor Characterization System
Category	Semiconductors
Model	4200-SCS
Manufacturer	Keithley
Voltage Range	±200V
Minimum Voltage Resolution	100 nV
Operating System	Windows
Measurement Capabilities	I-V, C-V, pulse, transient
Interface	GPIB, USB
Software	Keithley Test Environment (KTE)

Summary

Model 4200-SCS Semiconductor Characterization System User Manual

User Manual

Document providing detailed instructions for operating the Model 4200-SCS.

Safety Precautions

General Safety Precautions

Guidelines and warnings to ensure safe operation of the 4200-SCS and associated instrumentation.

Section 1 Getting Started

Installation and system connections

Guidance on unpacking, shipment contents, environmental considerations, and system connections.

Section 2 Model 4200-SCS Software Environment

Understanding KITE

Introduction to Keithley Interactive Test Environment (KITE) and its capabilities.

Section 3 Common Device Characterization Tests

How to perform an I-V test on my device

Guide to performing I-V tests on devices, covering default project overview and specific test types.

How to perform a C-V test on my device

Steps for performing C-V tests using KITE, including ITM configuration and terminal settings.

How to perform a Pulsed I-V test on my device

Methods for performing Pulse I-V testing using 4225-PMU or pulse packages like PIV-A and PIV-Q.

How to perform reliability (stress-measure) tests on my device

Connecting devices for stress / measure cycling

Section 4 How to Control Other Instruments with the Model 4200-SCS

How to control external equipment

Keithley Configuration Utility (KCON)

How to control a switch matrix

How to control a probe station

Section 5 How to Generate Basic Pulses

Keithley Pulse Application (KPulse)