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Keithley 4200-SCS User Manual

Keithley 4200-SCS
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2-16 Return to Section Topics 4200-900-01 Rev. K / February 2017
Section 2: Model 4200-SCS Software Environment Model 4200-SCS User’s Manual
Understanding pulse mode
To avoid device overheating in some tests, voltages or currents can be applied to a device only for
brief periods at widely spaced intervals. For sweep (linear, log, and list) and bias forcing functions,
a SMU can be set to provide pulse output.
With pulse mode enabled, the following pulse parameters can be set:
•On Time
Off Time
Base Voltage (or Base Current)
The base is the level the SMU goes to between sweep points. Pulse “on” and “off” times determine
pulse period and pulse width as follows:
Pulse period = On Time + Off Time + cumulative measure time (if set to measure)
Pulse width = On Time
Pulse mode can be selected only when source and measure ranges are fixed. Pulse mode is
disabled if the source or measure range is set to AUTO.
Pulse “on” and “off” times can be set from 5 ms to 10 s. The base voltage (or current) that can be
set is dependent upon the present source range.
An example pulse output for the voltage bias forcing function is shown in Figure 2-7. Pulse output
goes to the specified pulse level during the pulse “on” time. If the SMU is set to measure, the
measurement will occur after the “on” time expires and before the transition to the “off” time level.
This effectively increases the “on” time by the amount of time required to make the measurement.
Minimize this extra time by choosing “custom” in the timing tab and setting delay and filter factor to
0, and A / D Integration factor to 0.01. This is the fastest (but least accurate) measurement timing
scheme. If not set to measure, the output will transition from “on” to “off.”
During pulse “off” time, the pulse output returns to the specified base voltage level. After the “off”
time expires, the output returns to 0 V.
For a sweep forcing function, pulse output steps to the sweep step levels during the pulse “on”
times. During the “off” times, pulse output returns to the specified base voltage (or base current)
level. if set to measure, the measurement will occur after each “on” time period expires and before
the pulse transitions to the “off” time level.
The voltage sweep in Figure 2-8 is a single sweep. If dual sweep is enabled, the test will continue
by going back to the stop level and then step down to the start level. For details, see
Understanding dual sweep, on page 2-15.
Figure 2-7
Pulse mode example: Voltage bias; 2V level, 1V base
0V
Base Voltage 1V
Level 2V
Off Time
On Time
Cumulative Measurement Time
Time

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Keithley 4200-SCS Specifications

General IconGeneral
TypeSemiconductor Characterization System
CategorySemiconductors
Model4200-SCS
ManufacturerKeithley
Voltage Range±200V
Minimum Voltage Resolution100 nV
Operating SystemWindows
Measurement CapabilitiesI-V, C-V, pulse, transient
InterfaceGPIB, USB
SoftwareKeithley Test Environment (KTE)

Summary

Model 4200-SCS Semiconductor Characterization System User Manual

User Manual

Document providing detailed instructions for operating the Model 4200-SCS.

Safety Precautions

General Safety Precautions

Guidelines and warnings to ensure safe operation of the 4200-SCS and associated instrumentation.

Section 1 Getting Started

Installation and system connections

Guidance on unpacking, shipment contents, environmental considerations, and system connections.

Section 2 Model 4200-SCS Software Environment

Understanding KITE

Introduction to Keithley Interactive Test Environment (KITE) and its capabilities.

Section 3 Common Device Characterization Tests

How to perform an I-V test on my device

Guide to performing I-V tests on devices, covering default project overview and specific test types.

How to perform a C-V test on my device

Steps for performing C-V tests using KITE, including ITM configuration and terminal settings.

How to perform a Pulsed I-V test on my device

Methods for performing Pulse I-V testing using 4225-PMU or pulse packages like PIV-A and PIV-Q.

How to perform reliability (stress-measure) tests on my device

Section 4 How to Control Other Instruments with the Model 4200-SCS

Section 5 How to Generate Basic Pulses