4200-900-01 Rev. K / February 2017 Index-1
Index Model 4200-SCS User’s Manual
Symbols
“connect” parameters for “4terminal-n-fet” device .....
4-15
“cvsweep” UTM
.................................................. 4-43
“probesubsites” test descriptions
........................ 4-23
Numerics
4- terminal n-MOSFET tests ................................. 3-5
4200-SCS Hardware Overview
.......................... 1-10
59283
Heading Level 3
Average equivalent time points
.......... 1-31
72968
Heading Level 4
2.4.1.5 Project Plan
............................ 2-22
A
Acquisition sample rate ...................................... 1-30
Add a Device Plan
.............................................. 4-41
Add a new Device Plan to a KITE project
.......... 4-41
Add a new Subsite Plan
..................................... 4-41
Add a new Subsite Plan to a KITE project
......... 4-40
Add a switch card to the system configuration
... 4-10
Add a switch matrix to the system configuration
.. 4-9
Add a test fixture to the system configuration
...... 4-9
Add the “cvsweep” UTM
..................................... 4-42
Adding a Keithley 590 CV Analyzer to the system
configuration
............................................... 4-38
Adding a probe station
.............................4-20, 4-30
Adding a pulse generator
................................... 4-29
Adding a switch matrix
.............................4-19, 4-29
Advanced Connections
...................................... 1-37
B
Basic
ground unit characteristics
......................... 1-32
SMU source-measure configuration
........... 1-11
SMU/PreAmp source-measure configuration
....
1-14
Basic test execution
........................................... 2-21
Boot the system and log in
................................. 1-38
Buttons to close or reduce size of test documents
....
4-35
C
Calculate functions ............................................. 1-31
Changing KITE startup behavior
........................ 3-12
Chassis ground
.................................................. 1-35
Clear Append Data method for deleting Append
worksheets
................................................. 2-38
Compensation
.................................................... 3-20
Configuration
ITMs
........................................................... 2-17
Configuring the switch matrix
...................4-19, 4-30
Connect SMUs to N-channel MOSFET
.............. 4-24
Connect SMUs to NPN transistor
....................... 4-24
connect test
........................................................ 4-14
Connecting Devices Under Test (DUTs)
............ 1-36
Connecting the switch matrix
................... 4-20, 4-31
Connections
......................................................... 3-9
Contents of the Keithley Device file new-mosfet.kdv
.
2-28
Controlling a CV Analyzer
.................................. 4-37
Add a Device Plan
..................................... 4-41
Add a Subsite Plan
.................................... 4-40
Add a UTM
................................................. 4-42
Connections
............................................... 4-38
Create a new project
.................................. 4-39
KCON setup
............................................... 4-38
Modifying the “cvsweep” UTM
................... 4-43
Controlling a probe station
KCON setup
............................................... 4-19
Open the “probesubsites” project
.............. 4-21
Open the project plan window
................... 4-22
Probe station configuration
........................ 4-21
Prober control overview
............................. 4-16
Running the test sequence
........................ 4-25
Test data
.................................................... 4-26
Test descriptions
........................................ 4-22
Test system connections
........................... 4-18
Controlling a pulse generator
Compare the test results
............................ 4-35
Overlaying graphs
.............................. 4-36
Description of tests
.................................... 4-32
“pgu1-init” test
.................................... 4-33
“pgu1-setup” test
................................ 4-34
“pgu-trigger” test
................................ 4-34
First “connect” test
............................. 4-32
First “id-vg” test
.................................. 4-32
Second “connect” test
........................ 4-33
Second “id-vg” test
............................. 4-34
Third “connect” test
............................ 4-34
KCON setup
............................................... 4-28
Open the “ivpgswitch” project
.................... 4-31
Running the test sequence
........................ 4-35
Test system connections
........................... 4-28
Controlling a switch matrix
“connect” test description
........................... 4-14
Running test sequences
............................ 4-12
Controlling external equipment overview
............. 4-2
Copying entire KITE project
............................... 3-10
Copying individual tests using the test library manager
.................................................................... 3-11
CVU Frequency Sweep (bias)
........................... 3-24
CVU Frequency Sweep (step)
........................... 3-26
CVU Voltage Bias
.............................................. 3-21
CVU Voltage List Sweep
.................................... 3-23
CVU Voltage Sweep
.......................................... 3-22
D
Data Save As window ........................................ 2-36
Data worksheet of a Sheet tab containing both data
and Formulator results
............................... 2-33
Data worksheet of a Sheet tab containing data for
multiple sweeps
......................................... 2-33
Data-source identifier
......................................... 2-35
DC Preamp
........................................................ 1-14
Index
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